Description
The PANalytical Epsilon 3 XRF Spectrometer is a state-of-the-art benchtop energy-dispersive X-ray fluorescence (EDXRF) instrument designed for rapid and accurate elemental analysis. Engineered for versatility, the Epsilon 3 offers non-destructive testing for a wide range of applications, from research laboratories to industrial quality control. It offers non-destructive, multi-element analysis for a wide range of materials. Meanwhile, its advanced technology ensures rapid, reliable results, making it ideal for applications in mining, environmental monitoring, pharmaceuticals, and academia. It is built with robust construction and user-friendly software to ensure reliable performance and ease of use. Consequently, it is suitable for both novice and expert users. Key features include high sensitivity detection, multi-element analysis, and minimal sample preparation, making it an essential tool for professionals seeking precise material characterisation.
Features of the PANalytical Epsilon 3 XRF Spectrometer:
- Versatile Applications: Suitable for solids, liquids, powders, and thin films, accommodating diverse analytical needs
- Compact Design: Fits seamlessly into any laboratory setting without sacrificing performance.
- High Sensitivity and Precision: Detect trace elements with confidence
- Password Protected Parameters
- User-Configurable Applications/Conditions
- Large Power Button
- Menu Bar
- Tool Bar
- Status Bar
- Resizable Grid Cells
- Add/Delete Rows
- Recalibration Program
- Automatic Program Selection (APS)
- Short Measurement Program
- Initially Measures Key Elements
- Automatically Selects Suitable Application
- Advanced Results Handling
- 100-240 V
- 50-60 Hz
- Computer Included
- Software Included
Quick Start Guide for the PANalytical Epsilon 3 XRF
