Agilent Varian 725-ES ICP-OES

Description

The Agilent Varian 725-ES ICP-OES sets the standard for high-performance, reliable, and cost-effective elemental analysis. Designed with a vertical-oriented radial-view plasma, this system excels in tolerating difficult matrices and ensures stable performance even with high levels of salts or solids. Users benefit from the immediate venting of exhaust vapors, which contributes to robust operation under various conditions with minimal maintenance.

This instrument features continuous wavelength coverage, allowing for the selection of multiple wavelengths for each element. This capability optimises signal-to-noise ratios and eliminates spectral interferences, giving you maximum confidence in your results. The Echelle polychromator separates and focuses analyte emission lines generated in the plasma onto the CCD detector, ensuring precise and accurate measurements.

The VistaChip II hermetically sealed CCD detector eliminates the need for purging, covering the entire wavelength range with just 70,000 photosensitive pixels. The Agilent Varian 725-ES offers one-step measurement for major, minor, and trace elements, enabling fast warm-up and increasing throughput. The mass-flow controlled nebuliser gas and fully-automated operation enhance efficiency, while the compatibility with ICP Expert II software provides extended linear range, multi-calibration feature, and smart rinse capabilities.

Features of the Agilent Varian 725-ES ICP-OES:

Vertical Orientated Radial-View Plasma
- Tolerates Difficult Matrices
- Immediate Venting of Exhaust Vapours
Stable Performance
- Even with High Levels of Salts or Solids
Operatign Conditions:
- Temperature 10°C to 35°C
  - Ambient 20°C to 25°C
- Humidity 8 %RH to 80 %RH
Robust Operation
Minimal Maintenance
Continuous Wavelength Coverage
- Selectable Multiple Wavelengths for Given Element
Full Wavelength Coverage & High Resolution Optics
- Optimisable Signal-to-Noise
- Eliminates Spectral Interferences
Echelle Polychromator
- Separates & Focuses Analyte Emission Lines Generated in Plasma onto CCD
VistaChip II Hermetically Sealed CCD Detector
- Eliminated Need for Purging
- Exactly Matches Optical Image Produced by Echelle Optics
- Requires only 70,000 Photosensitive Pixels to Cover 167nm to 785nm Wavelength
One-Step Measurement
- Major, Minor & Trace Elements
Fast Warm-Up
Mass-Flow Controlled Nebuliser Gas
- Fully-Automated Operation
ICP Expert II Software:
- Multi-Cal Feature
  - Extends Linear Range
  - Monitors Results at 2+ Wavelengths
  - Useful for Mineralogical Samples
- Fitted Background Correction (FBC)
- Fast Automated Curve-Fitting (FACT)
- Smart Rinse
Includes Chiller
Includes Computer

Applications:

Industrial
- Major, Minor & Trace Elements in Brine
- Metal Impurities in Pure Hydroxides & Salts
Petrochemical
- S, P & Cu in Ethanol for Blending with Fuel
- Additive Elements, Wear Metals & Contaminants in Used Lubricating Oils
Environmental
- Pb, Cd & Cr in Electronics & Plastics
- Metals in Aqueous Wastes Containign Oils, Greases or Waxes
Food & Agriculture
- Extractable Cations & Nutrients in Soils
Metals/Mixing
- Au, Ag & Pt Group Elements in Ore Grade Material
- Major & Minor Components in Iron, Steel & Alloys
- Trace Elements in Geological Samples